biom:ImageSegmentVerticalOffsetMeasure
A distance in 10 micrometer units (0.01mm) from the top edge of an original image to the top edge of a rectangular image segment
Element information
Namespace: http://release.niem.gov/niem/domains/biometrics/4.1/
Schema document: domains/biometrics/4.1/biom.xsd
Type: biom:Integer0to50000Type
Properties: Global, Qualified, Nillable
Content
from type biom:Integer0to50000SimpleType
- Maximum inclusive: 50000
Attributes
| Name | Occ | Type | Description | Notes |
|---|---|---|---|---|
| structures:id | [0..1] | xsd:ID | from group structures:SimpleObjectAttributeGroup | |
| structures:ref | [0..1] | xsd:IDREF | from group structures:SimpleObjectAttributeGroup | |
| structures:uri | [0..1] | xsd:anyURI | from group structures:SimpleObjectAttributeGroup | |
| structures:metadata | [0..1] | xsd:IDREFS | from group structures:SimpleObjectAttributeGroup | |
| structures:relationshipMetadata | [0..1] | xsd:IDREFS | from group structures:SimpleObjectAttributeGroup | |
| Any attribute | [0..*] | Namespace: urn:us:gov:ic:ism urn:us:gov:ic:ntk, Process Contents: lax | from group structures:SimpleObjectAttributeGroup |
Used in
Sample instance
<biom:ImageSegmentVerticalOffsetMeasure>1</biom:ImageSegmentVerticalOffsetMeasure>